| Makale Türü |
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| Dergi Adı | Journal of Electronic Testing Theory and Applications JETTA | ||
| Dergi ISSN | 0923-8174 Wos Dergi Scopus Dergi | ||
| Dergi Tarandığı Indeksler | SCI-Expanded | ||
| Makale Dili | İngilizce | Basım Tarihi | 10-2007 |
| Kabul Tarihi | – | Yayınlanma Tarihi | 13-09-2007 |
| Cilt / Sayı / Sayfa | 23 / 5 / 405–420 | DOI | 10.1007/s10836-007-5009-3 |
| Makale Linki | http://dl.acm.org/citation.cfm?id=1315697.1315716&coll=DL&dl=GUIDE&CFID=67251196&CFTOKEN=99503634 | ||
| UAK Araştırma Alanları |
Algoritmalar ve Hesaplama Kuramı
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| Özet |
| This article describes an emulation-based method for locating stuck-at faults in combinational and synchronous sequential circuits. The method is based on automatically designing a circuit which implements a closest-match fault location algorithm specialized for the circuit under diagnosis (CUD). This method allows designers to perform dynamic fault location of stuck-at faults in large circuits, and eliminates the need for large storage required by a software-based fault dictionary. In fact, the approach is a pure hardware solution to fault diagnosis. We demonstrate the feasibility of the method in terms of hardware resources and diagnosis time by experimenting with ISCAS85 and ISCAS89 circuits. The emulation-based diagnosis method speeds up the diagnosis process by an order of magnitude compared to the software-based fault diagnosis. This speed-up is important, especially, when the on-line diagnosis of safety … |
| Anahtar Kelimeler |
| Circuits | Dynamic fault diagnosis | Emulation | FPGA | Gate-level | Stuck-at faults |
| Atıf Sayıları | |
| Web of Science | 5 |
| Google Scholar | 10 |
| Dergi Adı | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS |
| Yayıncı | Springer Netherlands |
| Açık Erişim | Hayır |
| ISSN | 0923-8174 |
| E-ISSN | 1573-0727 |
| CiteScore | 2,4 |
| SJR | 0,316 |
| SNIP | 0,789 |